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dc.contributor.authorBeck, James A
dc.contributor.authorBudgell, Geoff J
dc.contributor.authorRoberts, D A
dc.contributor.authorEvans, P M
dc.date.accessioned2009-06-05T10:22:09Z
dc.date.available2009-06-05T10:22:09Z
dc.date.issued2009-04
dc.identifier.citationElectron beam quality control using an amorphous silicon EPID., 2009, 36 (5):1859-1866 Med Physen
dc.identifier.issn00942405
dc.identifier.doi10.1118/1.3110671
dc.identifier.urihttp://hdl.handle.net/10541/69772
dc.language.isoenen
dc.subjectAmorphousen
dc.subjectSemiconductorsen
dc.subjectBiomedical Equipmenten
dc.subjectBiomedical Imagingen
dc.subjectLinear Acceleratorsen
dc.titleElectron beam quality control using an amorphous silicon EPIDen
dc.typeArticleen
dc.contributor.departmentNorth Western Medical Physics, Christie Hospital NHS Foundation Trust, Withington, Manchester M20 4BX, United Kingdom.en
dc.identifier.journalMedical Physicsen


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