Publication

Electron beam quality control using an amorphous silicon EPID

Beck, James A
; 
Budgell, Geoff J
; 
Roberts, D A
; 
Evans, P M
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Abstract
Authors
Beck, James A
Budgell, Geoff J
Roberts, D A
Evans, P M
Affiliation
North Western Medical Physics, Christie Hospital NHS Foundation Trust, Withington, Manchester M20 4BX, United Kingdom.
Description
Date
2009-04
Publisher
Collections
All Christie Publications
Christie Medical Physics and Engineering Research
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Keywords
Amorphous
Semiconductors
Biomedical Equipment
Biomedical Imaging
Linear Accelerators
Type
Article
Citation
Electron beam quality control using an amorphous silicon EPID., 2009, 36 (5):1859-1866 Med Phys
Journal Title
Journal ISSN
Volume Title
URI
http://hdl.handle.net/10541/69772
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