2.50
Hdl Handle:
http://hdl.handle.net/10541/69772
Title:
Electron beam quality control using an amorphous silicon EPID
Authors:
Beck, James A; Budgell, Geoff J; Roberts, D A; Evans, P M
Affiliation:
North Western Medical Physics, Christie Hospital NHS Foundation Trust, Withington, Manchester M20 4BX, United Kingdom.
Citation:
Electron beam quality control using an amorphous silicon EPID., 2009, 36 (5):1859-1866 Med Phys
Journal:
Medical Physics
Issue Date:
Apr-2009
URI:
http://hdl.handle.net/10541/69772
DOI:
10.1118/1.3110671
Type:
Article
Language:
en
ISSN:
00942405
Appears in Collections:
All Christie Publications ; Christie Medical Physics and Engineering Research

Full metadata record

DC FieldValue Language
dc.contributor.authorBeck, James A-
dc.contributor.authorBudgell, Geoff J-
dc.contributor.authorRoberts, D A-
dc.contributor.authorEvans, P M-
dc.date.accessioned2009-06-05T10:22:09Z-
dc.date.available2009-06-05T10:22:09Z-
dc.date.issued2009-04-
dc.identifier.citationElectron beam quality control using an amorphous silicon EPID., 2009, 36 (5):1859-1866 Med Physen
dc.identifier.issn00942405-
dc.identifier.doi10.1118/1.3110671-
dc.identifier.urihttp://hdl.handle.net/10541/69772-
dc.language.isoenen
dc.subjectAmorphousen
dc.subjectSemiconductorsen
dc.subjectBiomedical Equipmenten
dc.subjectBiomedical Imagingen
dc.subjectLinear Acceleratorsen
dc.titleElectron beam quality control using an amorphous silicon EPIDen
dc.typeArticleen
dc.contributor.departmentNorth Western Medical Physics, Christie Hospital NHS Foundation Trust, Withington, Manchester M20 4BX, United Kingdom.en
dc.identifier.journalMedical Physicsen
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